发明授权
- 专利标题: Method and an apparatus for a waveform quality measurement
- 专利标题(中): 用于波形质量测量的方法和装置
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申请号: US09738586申请日: 2000-12-14
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公开(公告)号: US06693920B2公开(公告)日: 2004-02-17
- 发明人: Juan Montojo , Nagabhushana Sindhushayana , Peter Black
- 申请人: Juan Montojo , Nagabhushana Sindhushayana , Peter Black
- 主分类号: H04J306
- IPC分类号: H04J306
摘要:
A method and an apparatus for waveform quality measurement are disclosed. An actual signal, representing a waveform channelized both in time and in code is generated by, e.g., an exemplary HDR communication system. Test equipment generates an ideal waveform corresponding to the actual waveform. The test equipment then generates an estimate of offsets between parameters of the actual waveform and the ideal waveform, and the offsets are used to compensate the actual waveform. The test equipment then evaluates various waveform quality measurements utilizing the compensated actual waveform and the corresponding ideal waveform. Definitions of the various waveform quality measurements as well as conceptual and practical examples of processing of the actual waveform and the corresponding ideal waveform by the test equipment are disclosed. The disclosed method and apparatus may be extended to any waveform channelized both in time and in code regardless of the equipment that generated the waveform.
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