Invention Grant
- Patent Title: Method and an apparatus for a waveform quality measurement
- Patent Title (中): 用于波形质量测量的方法和装置
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Application No.: US09738586Application Date: 2000-12-14
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Publication No.: US06693920B2Publication Date: 2004-02-17
- Inventor: Juan Montojo , Nagabhushana Sindhushayana , Peter Black
- Applicant: Juan Montojo , Nagabhushana Sindhushayana , Peter Black
- Main IPC: H04J306
- IPC: H04J306

Abstract:
A method and an apparatus for waveform quality measurement are disclosed. An actual signal, representing a waveform channelized both in time and in code is generated by, e.g., an exemplary HDR communication system. Test equipment generates an ideal waveform corresponding to the actual waveform. The test equipment then generates an estimate of offsets between parameters of the actual waveform and the ideal waveform, and the offsets are used to compensate the actual waveform. The test equipment then evaluates various waveform quality measurements utilizing the compensated actual waveform and the corresponding ideal waveform. Definitions of the various waveform quality measurements as well as conceptual and practical examples of processing of the actual waveform and the corresponding ideal waveform by the test equipment are disclosed. The disclosed method and apparatus may be extended to any waveform channelized both in time and in code regardless of the equipment that generated the waveform.
Public/Granted literature
- US20020114353A1 Method and an apparatus for a waveform quality measurement Public/Granted day:2002-08-22
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