发明授权
- 专利标题: Reconfigurable integrated circuit with integrated debugging facilities and scalable programmable interconnect
- 专利标题(中): 具有集成调试功能和可扩展可编程互连的可重构集成电路
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申请号: US10086813申请日: 2002-02-28
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公开(公告)号: US06717433B2公开(公告)日: 2004-04-06
- 发明人: Jean Barbier , Olivier LePape , Frederic Reblewski
- 申请人: Jean Barbier , Olivier LePape , Frederic Reblewski
- 主分类号: H03K1900
- IPC分类号: H03K1900
摘要:
A number of enhanced logic elements (LEs) are provided to form a reconfigurable integrated circuit (IC). Each enhanced LE comprises a multiple input-single output truth table, and a complementary pair of master-slave latches having a data, a set and a reset input. Each enhanced LE further comprises a plurality of multiplexers and buffers, and control logic. Additionally, the improved IC may further comprises a scalable network of crossbars, a context bus, a scan register, and/or a plurality of trigger circuitry. As a result, each LE may be individually initialized, its signal state frozen momentarily, the frozen state be read, trace data be output, and trigger inputs be conditionally generated, making the IC particularly suitable for circuit design emulation. Furthermore, the enhanced LEs may be used for “level sensitive” as well as “edge sensitive” circuit design emulations.
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