- 专利标题: Methods for making semiconductor structures having high-speed areas and high-density areas
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申请号: US09945077申请日: 2001-08-30
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公开(公告)号: US06730553B2公开(公告)日: 2004-05-04
- 发明人: Chih-Chen Cho , Zhongze Wang
- 申请人: Chih-Chen Cho , Zhongze Wang
- 主分类号: H01L218234
- IPC分类号: H01L218234
摘要:
Methods for making a semiconductor structure are discussed. The methods include forming openings in a high-density area and a high-speed area, and forming a metallization layer simultaneously into the high-density area and the high-speed area. The metallization layer includes a combination of substances and compounds that reduce vertical resistance, reduce horizontal resistance, and inhibit cross-diffusion.
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