• 专利标题: Methods for making semiconductor structures having high-speed areas and high-density areas
  • 申请号: US09945077
    申请日: 2001-08-30
  • 公开(公告)号: US06730553B2
    公开(公告)日: 2004-05-04
  • 发明人: Chih-Chen ChoZhongze Wang
  • 申请人: Chih-Chen ChoZhongze Wang
  • 主分类号: H01L218234
  • IPC分类号: H01L218234
Methods for making semiconductor structures having high-speed areas and high-density areas
摘要:
Methods for making a semiconductor structure are discussed. The methods include forming openings in a high-density area and a high-speed area, and forming a metallization layer simultaneously into the high-density area and the high-speed area. The metallization layer includes a combination of substances and compounds that reduce vertical resistance, reduce horizontal resistance, and inhibit cross-diffusion.
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