发明授权
US06735112B2 Magneto-resistive memory cell structures with improved selectivity 有权
具有改善选择性的磁阻存储单元结构

  • 专利标题: Magneto-resistive memory cell structures with improved selectivity
  • 专利标题(中): 具有改善选择性的磁阻存储单元结构
  • 申请号: US10068465
    申请日: 2002-02-06
  • 公开(公告)号: US06735112B2
    公开(公告)日: 2004-05-11
  • 发明人: Theodore ZhuYong LuAnthony Arrott
  • 申请人: Theodore ZhuYong LuAnthony Arrott
  • 主分类号: G11C1115
  • IPC分类号: G11C1115
Magneto-resistive memory cell structures with improved selectivity
摘要:
A magneto-resistive memory comprising magneto-resistive memory cells is disclosed, comprising two pinned magnetic layers on one side of a free magnetic layer. The pinned magnetic layers are formed with anti-parallel magnetization orientations such that a net magnetic moment of the two layers is substantially zero. The influence of pinned magnetic layers on free magnetic layer magnetization orientations is substantially eliminated, allowing for increased predictability in switching behavior and increased write selectivity of memory cells.
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