发明授权
- 专利标题: FEMFET device and method for producing same
- 专利标题(中): FEMFET器件及其制造方法
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申请号: US09857262申请日: 2001-07-16
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公开(公告)号: US06737689B1公开(公告)日: 2004-05-18
- 发明人: Till Schlösser , Thomas Haneder
- 申请人: Till Schlösser , Thomas Haneder
- 优先权: DE19857038 19981210
- 主分类号: H01L2976
- IPC分类号: H01L2976
摘要:
The present invention relates to a FEMFET device with a semiconductor substrate and to at least one field effect transistor that is provided in the semiconductor substrate. The field effect transistor has a source area, a drain area, a channel area and a gate stack. The gate stack has at least one ferroelectric layer and at least one thin diffusion barrier layer being arranged between the lowest ferroelectric layer and the semiconductor substrate and being configured in such a way that an out-diffusion of the components of the ferroelectric layer into the semiconductor substrate is essentially prevented.
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