Invention Grant
- Patent Title: Objective lens for a charged particle beam device
- Patent Title (中): 用于带电粒子束装置的物镜
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Application No.: US10182437Application Date: 2002-10-03
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Publication No.: US06747279B2Publication Date: 2004-06-08
- Inventor: Pavel Adamec
- Applicant: Pavel Adamec
- Priority: EP00101708 20000127
- Main IPC: H01J3710
- IPC: H01J3710

Abstract:
An improved objective lens for a charged particle beam device is constituted by, among other things, a magnetic lens that creates a first magnetic field for focussing the charged particle beam onto the specimen. Furthermore, a deflector is integrated into the magnetic lens by providing at least one additional coil arrangement that creates a second magnetic field used to deflect the charged particle beam. Thereby, the second magnetic field is guided through at least one of the pole pieces of the magnetic lens. The present invention also provides an improved column for a charged particle beam device including the improved objective lens.
Public/Granted literature
- US20030089859A1 Objective lens for a charged particle beam device Public/Granted day:2003-05-15
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