发明授权
US06750946B2 Processing apparatus for processing sample in predetermined atmosphere
失效
用于在预定气氛中处理样品的处理装置
- 专利标题: Processing apparatus for processing sample in predetermined atmosphere
- 专利标题(中): 用于在预定气氛中处理样品的处理装置
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申请号: US09897930申请日: 2001-07-05
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公开(公告)号: US06750946B2公开(公告)日: 2004-06-15
- 发明人: Yutaka Tanaka , Shigeru Terashima , Shinichi Hara
- 申请人: Yutaka Tanaka , Shigeru Terashima , Shinichi Hara
- 优先权: JP2000-204491 20000706
- 主分类号: G03B2752
- IPC分类号: G03B2752
摘要:
A substrate processing system has a first processing device which processes a substrate with a first process in a first gas atmosphere within a process chamber and a transfer device that transfers a substrate in a second gas atmosphere within a clean booth, the transfer device transferring a substrate which has been processed with a second process by a second processing device or a substrate which is to be processed by that second processing device. A load-lock chamber has a substrate transfer path between the first processing device and the transfer device and there is a gas supply device which supplies the first gas from the process chamber to the load-lock chamber when the substrate is transferred between the load-lock chamber and a first processing device, and supplies the second gas from the clean booth to the load-lock chamber when the substrate is transferred between the load-lock chamber and the transfer device.
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