Invention Grant
- Patent Title: Three-dimensional shape measuring method
- Patent Title (中): 三维形状测量方法
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Application No.: US09995128Application Date: 2001-11-27
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Publication No.: US06750975B2Publication Date: 2004-06-15
- Inventor: Mitsuo Takeda , Teruaki Yogo , Hideyuki Tanaka , Ruowei Gu
- Applicant: Mitsuo Takeda , Teruaki Yogo , Hideyuki Tanaka , Ruowei Gu
- Priority: JP2001-122723 20010420
- Main IPC: G01B1124
- IPC: G01B1124

Abstract:
A three-dimensional shape measuring method by which measurement of a three-dimensional shape is realized with an improved precision. Grid patterns comprising a plurality of one-dimensional grids 1, 2 and 3, each having a period and direction different from those of the others, are simultaneously projected upon objects to be measured, using different colors for each of the one-dimensional grids 1, 2 and 3. Subsequently, a grid image deformed in accordance with the three-dimensional shapes of the objects to be measured is imaged, the grid image is separated by colors into one-dimensional grid components of each color, a phase for each of the one-dimensional grid components is detected, and then, measurement values of the three-dimensional shapes are obtained on the basis of the detected phases. At the same time, by imaging the objects to be measured by use of white light, color information on the objects to be measured are measured as well.
Public/Granted literature
- US20030016366A1 Three-dimensional shape measuring method Public/Granted day:2003-01-23
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