• 专利标题: Interconnect structure
  • 申请号: US10060880
    申请日: 2002-01-29
  • 公开(公告)号: US06756244B2
    公开(公告)日: 2004-06-29
  • 发明人: John Liebeskind
  • 申请人: John Liebeskind
  • 主分类号: H01L2166
  • IPC分类号: H01L2166
Interconnect structure
摘要:
An interconnect structure including a substrate, an interconnect device formed on the substrate, and a test device formed on the substrate.
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