Invention Grant
- Patent Title: Measurement apparatus
- Patent Title (中): 测量装置
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Application No.: US10058288Application Date: 2002-01-30
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Publication No.: US06760117B2Publication Date: 2004-07-06
- Inventor: David Neil Slatter
- Applicant: David Neil Slatter
- Priority: GB0102413 20010131
- Main IPC: G01B1114
- IPC: G01B1114

Abstract:
Measurement apparatus for measuring at least one of a length, surface area or volume of an object (or portion thereof) or area (22) (or portion thereof). The apparatus includes means for creating a three-dimensional map of an object or area to be measured and a touch-sensitive screen (16) for displaying the mapped image of the object or area. The user can select the area (22) of interest by drawing around it on the screen to create an outline of its shape and the apparatus then creates a virtual shape (20) which matches the outline and maps it onto the image. The user can alter the size, angle, pitch, etc. of the virtual shape (20) until it matches the area (22) exactly and the apparatus then determines the length, surface area and/or volume of the area (22), as required.
Public/Granted literature
- US20020101594A1 Measurement apparatus Public/Granted day:2002-08-01
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