发明授权
- 专利标题: Low temperature plasma Si or SiGe for MEMS applications
- 专利标题(中): 用于MEMS应用的低温等离子体Si或SiGe
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申请号: US10210315申请日: 2002-08-01
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公开(公告)号: US06770569B2公开(公告)日: 2004-08-03
- 发明人: Juergen A. Foerstner , Steven M. Smith , Raymond Mervin Roop
- 申请人: Juergen A. Foerstner , Steven M. Smith , Raymond Mervin Roop
- 主分类号: H01L2131
- IPC分类号: H01L2131
摘要:
A method is provided for making a MEMS structure (69). In accordance with the method, a CMOS substrate (51) is provided which has interconnect metal (53) deposited thereon. A MEMS structure is created on the substrate through the plasma assisted chemical vapor deposition (PACVD) of a material selected from the group consisting of silicon and silicon-germanium alloys. The low deposition temperatures attendant to the use of PACVD allow these materials to be used for MEMS fabrication at the back end of an integrated CMOS process.
公开/授权文献
- US20040023429A1 Low temperature plasma Si or SiGe for MEMS applications 公开/授权日:2004-02-05
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