发明授权
- 专利标题: Cross talk bit error rate testing of a magnetic head
- 专利标题(中): 磁头的串扰误码率测试
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申请号: US10229459申请日: 2002-08-27
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公开(公告)号: US06777929B2公开(公告)日: 2004-08-17
- 发明人: Peter Cheng-I Fang , Terence Tin-Lok Lam , Zhong-heng Lin
- 申请人: Peter Cheng-I Fang , Terence Tin-Lok Lam , Zhong-heng Lin
- 主分类号: G01R3312
- IPC分类号: G01R3312
摘要:
A process, computer program product, and apparatus for detecting and quantifying crosstalk instability in a read/write mechanism are provided. A write current is varied in a write circuit for exciting the write head. Measurements are taken of a magnetoresistive impedance of a read current of a read circuit. Measurements are also taken of a signal amplitude in the read circuit. A bit error rate of the overall system is also measured. The read/write mechanism is failed if the signal amplitude changes by a predetermined amount during the varying of the write current. Likewise, the read/write mechanism is failed if the error rate changes by a predetermined amount during the varying of the write current. The write-to-read signal coupling of HGA (Head Gimbal Assembly) and HSA (Head Stack Assembly), including GMR sensor, suspension and flex cable on the actuator arm, can be evaluated at component design level. The methodologies successfully simulate GMR cross talk instability inside a drive on magnetic testers. Therefore, a good prediction of drive failure rate can be achieved.
公开/授权文献
- US20040041559A1 Cross talk bit error rate testing of a magnetic head 公开/授权日:2004-03-04
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