发明授权
US06781877B2 Techniques for reducing effects of coupling between storage elements of adjacent rows of memory cells
有权
用于减少相邻行存储单元的存储元件之间的耦合效应的技术
- 专利标题: Techniques for reducing effects of coupling between storage elements of adjacent rows of memory cells
- 专利标题(中): 用于减少相邻行存储单元的存储元件之间的耦合效应的技术
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申请号: US10237426申请日: 2002-09-06
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公开(公告)号: US06781877B2公开(公告)日: 2004-08-24
- 发明人: Raul-Adrian Cernea , Khandker N. Quader , Yan Li , Jian Chen , Yupin Fong
- 申请人: Raul-Adrian Cernea , Khandker N. Quader , Yan Li , Jian Chen , Yupin Fong
- 主分类号: G11C1604
- IPC分类号: G11C1604
摘要:
Techniques of reducing erroneous readings of the apparent charge levels stored in a number of rows of memory cells on account of capacitive coupling between the cells. All pages of a first row are programmed with a first pass, followed by programming all pages of a second adjacent row with a first pass, after which the first row is programmed with a second pass, and then all pages of a third row are programmed with a first pass, followed by returning to program the second row with a second pass, and so on, in a back-and-forth manner across the rows of an array. This minimizes the effect on the apparent charge stored on rows of memory cells that can occur by later writing data into adjacent rows of memory cells.
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