发明授权
- 专利标题： Handling apparatus and test set using the handling apparatus
- 专利标题（中）： 处理装置和使用处理装置的试验装置
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申请号： US10302834申请日： 2002-11-25
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公开(公告)号： US06784657B2公开(公告)日： 2004-08-31
- 发明人: Keiji Fujishiro , Yasunori Sato , Shigeyuki Maruyama , Naohito Kohashi
- 申请人： Keiji Fujishiro , Yasunori Sato , Shigeyuki Maruyama , Naohito Kohashi
- 优先权： JP2002-158996 20020531
- 主分类号： G01R3102
- IPC分类号： G01R3102
摘要：
A handling apparatus includes a main unit, a holder configured to hold an object, a retainer configured to retain the holder so as to allow the holder to displace with respect to the main unit, and a latch unit configured to selectively bring the holder into a latched state, in which the displacement of the holder with respect to the main unit is restrained, or an unlatched state, in which the displacement of the holder with respect to the main unit is not restrained.
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