发明授权
US06790751B2 Semiconductor substrate for a one-chip electronic device and related manufacturing method 失效
一种单芯片电子器件半导体衬底及相关制造方法

  • 专利标题: Semiconductor substrate for a one-chip electronic device and related manufacturing method
  • 专利标题(中): 一种单芯片电子器件半导体衬底及相关制造方法
  • 申请号: US10259580
    申请日: 2002-09-30
  • 公开(公告)号: US06790751B2
    公开(公告)日: 2004-09-14
  • 发明人: Kazuhiro TsurutaNobuaki Kawahara
  • 申请人: Kazuhiro TsurutaNobuaki Kawahara
  • 优先权: JP2001-308496 20011004; JP2002-009220 20020117
  • 主分类号: H01L21425
  • IPC分类号: H01L21425
Semiconductor substrate for a one-chip electronic device and related manufacturing method
摘要:
A plurality of grooves, each having a depth of 10 &mgr;m or more and arranged adjacent to each other, are formed at a predetermined portion of a semiconductor substrate where a passive element is formed. Then, a thermal oxidation treatment is performed to let an oxide film grow from an inside surface of each groove so as to fill an inside space of the groove with a thermal oxide film thus grown and turn an entire portion intervening between adjacent grooves into a thermal oxide layer. Each groove has a width of 1 &mgr;m or less, and a width of a semiconductor material intervening between two adjacent grooves is 81.8% or more with respect to the groove width.
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