发明授权
US06791484B1 Method and apparatus of system offset calibration with overranging ADC
有权
具有超频ADC的系统偏移校准的方法和装置
- 专利标题: Method and apparatus of system offset calibration with overranging ADC
- 专利标题(中): 具有超频ADC的系统偏移校准的方法和装置
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申请号: US10623149申请日: 2003-07-18
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公开(公告)号: US06791484B1公开(公告)日: 2004-09-14
- 发明人: Bumha Lee , Brian D. Segerstedt , Christina P. Phan
- 申请人: Bumha Lee , Brian D. Segerstedt , Christina P. Phan
- 主分类号: H03M106
- IPC分类号: H03M106
摘要:
A method and apparatus for system offset calibration using an overranging ADC is provided. The overranging ADC is configured to convert an analog signal into an intermediary digital signal. The conversion range of the overranging ADC is extended beyond the full dynamic range of the ADC system. The intermediary digital signal has more bits than the digital output signal. A digital fine offset adjustment circuit is configured to provide the digital output signal by digitally subtracting a fine offset from the intermediary digital signal and decoding the intermediary digital signal. The digital output signal has approximately no offset, and has approximately no loss in dynamic range.
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