Invention Grant
- Patent Title: Wavelength measurement apparatus
- Patent Title (中): 波长测量装置
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Application No.: US10077673Application Date: 2002-02-15
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Publication No.: US06795196B2Publication Date: 2004-09-21
- Inventor: Seiji Funakawa
- Applicant: Seiji Funakawa
- Priority: JPP.2001-038841 20010215; JPP.2001-065360 20010308
- Main IPC: G01B902
- IPC: G01B902

Abstract:
Light under measurement whose wavelength is continuously swept is incident on fiber-optic Etalon. The fiber-optic Etalon transmits the light under measurement each time the wavelength of the light under measurement satisfies specific conditions. A PD detects the transmitted light of the fiber-optic Etalon and outputs the intensity of the light under measurement. A counter counts the number of peaks of the output of the PD. A CPU calculates the wavelength of the light under measurement based on the count value of the counter.
Public/Granted literature
- US20020130252A1 Wavelength measurement apparatus Public/Granted day:2002-09-19
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