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US06795196B2 Wavelength measurement apparatus 失效
波长测量装置

  • Patent Title: Wavelength measurement apparatus
  • Patent Title (中): 波长测量装置
  • Application No.: US10077673
    Application Date: 2002-02-15
  • Publication No.: US06795196B2
    Publication Date: 2004-09-21
  • Inventor: Seiji Funakawa
  • Applicant: Seiji Funakawa
  • Priority: JPP.2001-038841 20010215; JPP.2001-065360 20010308
  • Main IPC: G01B902
  • IPC: G01B902
Wavelength measurement apparatus
Abstract:
Light under measurement whose wavelength is continuously swept is incident on fiber-optic Etalon. The fiber-optic Etalon transmits the light under measurement each time the wavelength of the light under measurement satisfies specific conditions. A PD detects the transmitted light of the fiber-optic Etalon and outputs the intensity of the light under measurement. A counter counts the number of peaks of the output of the PD. A CPU calculates the wavelength of the light under measurement based on the count value of the counter.
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