发明授权
- 专利标题: Precision dielectric etch using hexafluorobutadiene
- 专利标题(中): 使用六氟丁二烯的精密电介质蚀刻
-
申请号: US10165249申请日: 2002-06-07
-
公开(公告)号: US06800213B2公开(公告)日: 2004-10-05
- 发明人: Ji Ding , Hidehiro Kojiri , Yoshio Ishikawa , Keiji Horioka , Ruiping Wang , Robert W. Wu , Hoiman (Raymond) Hung
- 申请人: Ji Ding , Hidehiro Kojiri , Yoshio Ishikawa , Keiji Horioka , Ruiping Wang , Robert W. Wu , Hoiman (Raymond) Hung
- 主分类号: H01L213065
- IPC分类号: H01L213065
摘要:
An oxide etching recipe including a heavy hydrogen-free fluorocarbon having F/C ratios less than 2, preferably C4F6, an oxygen-containing gas such as O2 or CO, a lighter fluorocarbon or hydrofluorocarbon, and a noble diluent gas such as Ar or Xe. The amounts of the first three gases are chosen such that the ratio (F—H)/(C—O) is at least 1.5 and no more than 2. Alternatively, the gas mixture may include the heavy fluorocarbon, carbon tetrafluoride, and the diluent with the ratio of the first two chosen such the ratio F/C is between 1.5 and 2.
公开/授权文献
- US20030036287A1 Precision dielectric etch using hexafluorobutadiene 公开/授权日:2003-02-20
信息查询