• 专利标题: Semiconductor device production method and semiconductor device production apparatus
  • 申请号: US10637581
    申请日: 2003-08-11
  • 公开(公告)号: US06805138B2
    公开(公告)日: 2004-10-19
  • 发明人: Ade Asneil AkbarTakayuki Ohba
  • 申请人: Ade Asneil AkbarTakayuki Ohba
  • 优先权: JP2002-009785 20020118
  • 主分类号: H01L600
  • IPC分类号: H01L600
Semiconductor device production method and semiconductor device production apparatus
摘要:
A semiconductor device production method that is used to uniformly and efficiently reduce metal oxides produced on metal (copper, for example) which forms electrodes or wirings on a semiconductor device. An object to be treated on which copper oxides are produced is put into a process chamber and is heated by a heater to a predetermined temperature. Then carboxylic acid stored in a storage tank is vaporized by a carburetor. The vaporized carboxylic acid, together with carrier gas, is introduced into the process chamber via a treating gas feed pipe to reduce the copper oxides produced on the object to be treated to metal copper. As a result, metal oxides can be reduced uniformly without making the surfaces of electrodes or wirings irregular. Moreover, in this case, carbon dioxide and water are both produced in a gaseous state. This prevents impurities from remaining on the surface of copper.
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