发明授权
- 专利标题： Evaluation configuration for semiconductor memories
- 专利标题（中）： 半导体存储器的评估配置
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申请号： US10244258申请日： 2002-09-16
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公开(公告)号： US06806550B2公开(公告)日： 2004-10-19
- 发明人: Kurt Hoffmann , Oskar Kowarik
- 申请人： Kurt Hoffmann , Oskar Kowarik
- 优先权： DE10145556 20010914
- 主分类号： H01L2900
- IPC分类号： H01L2900
摘要：
An evaluation configuration has a first MOS evaluation stage, an isolation stage, and a bipolar evaluation stage. The isolation stage is connected between the first MOS evaluation stage and the bipolar evaluation stage. The isolation stage isolates the first MOS evaluation stage from the bipolar evaluation stage. The evaluation configuration can reliably detect very small read signals and allows a high integration density.
公开/授权文献
- US20030052344A1 Evaluation configuration for semiconductor memories 公开/授权日：2003-03-20