发明授权
- 专利标题： Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof
- 专利标题（中）： 半导体激光二极管及其波长检测单元的波长检查方法
-
申请号： US10180032申请日： 2002-06-27
-
公开(公告)号： US06807199B2公开(公告)日： 2004-10-19
- 发明人: Haruyoshi Ono , Isao Baba
- 申请人： Haruyoshi Ono , Isao Baba
- 优先权： JP2001-198337 20010629
- 主分类号： H01S310
- IPC分类号： H01S310
摘要：
In order to tune an oscillation wavelength of a semiconductor laser diode to a target wavelength, the amount of change of a wavelength to the amount of change of a wavelength varying item is determined by actual measurement and a basic wavelength coefficient is renewed by using the ratio of both amounts of change as a corrective wavelength coefficient, and thus the characteristic when the wavelength of an actual device is made closer to a target wavelength is utilized.
公开/授权文献
信息查询
