发明授权
US06815658B2 Testing circuit for charge detection circuit, LSI, image sensor, and testing method for the charge detection circuit
有权
充电检测电路测试电路，LSI，图像传感器，以及充电检测电路的测试方法
- 专利标题： Testing circuit for charge detection circuit, LSI, image sensor, and testing method for the charge detection circuit
- 专利标题（中）： 充电检测电路测试电路，LSI，图像传感器，以及充电检测电路的测试方法
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申请号： US10252686申请日： 2002-09-24
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公开(公告)号： US06815658B2公开(公告)日： 2004-11-09
- 发明人: Hisao Okada , Masayuki Takahashi , Hiroaki Ogawa
- 申请人： Hisao Okada , Masayuki Takahashi , Hiroaki Ogawa
- 优先权： JP2001-329809 20011026
- 主分类号： H01J4014
- IPC分类号： H01J4014
摘要：
A testing circuit 1, provided between an input terminal IN of an LSI 2 and the CSA 20, includes a switch NSW (a third switch), a capacitor CT which is connected in parallel to the switch NSW, and switches TC1 (a first switch) and TC2 (a second switch) which are connected in series across the capacitor CT. With this arrangement, the circuit including the capacitor CT and the CSA 20 can serve as a reverse amplifier circuit and can input a voltage waveform instead of the charges. Therefore, a conventional charge supply circuit is not necessary when the testing of a reading circuit 16 is carried out.
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