发明授权
- 专利标题: Method of etching substrates
- 专利标题(中): 蚀刻基板的方法
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申请号: US10118318申请日: 2002-04-09
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公开(公告)号: US06818532B2公开(公告)日: 2004-11-16
- 发明人: Geun-young Yeom , Myung cheol Yoo , Wolfram Urbanek , Youn-joon Sung , Chang-hyun Jeong , Kyong-nam Kim , Dong-woo Kim
- 申请人: Geun-young Yeom , Myung cheol Yoo , Wolfram Urbanek , Youn-joon Sung , Chang-hyun Jeong , Kyong-nam Kim , Dong-woo Kim
- 主分类号: H01L2146
- IPC分类号: H01L2146
摘要:
Thinning and dicing substrates using inductively coupled plasma reactive ion etching (ICP RIE). When dicing, a hard photo-resist pattern or metal mask pattern that defines scribe lines is formed on a sapphire substrate or on a semiconductor epitaxial layer, beneficially by lithographic techniques. Then, the substrate is etched along the scribe lines to form etched channels. An etching gas comprised of BCl3 and/or BCl3/Cl2 gas is used (optionally, Ar can be added). Stress lines are then produced through the substrate along the etched channels. The substrate is then diced along the stress lines. When thinning, a surface of a substrate is subjected to inductively coupled plasma reactive ion etching (ICP RIE) using BCl3 and/or BCl3/Cl2 gas, possibly with some Ar. ICP RIE is particularly useful when working sapphire and other hard substrates.
公开/授权文献
- US20030190770A1 Method of etching substrates 公开/授权日:2003-10-09
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