发明授权
US06833578B1 Method and structure improving isolation between memory cell passing gate and capacitor 有权
存储单元通过栅极和电容器之间的隔离方法和结构

Method and structure improving isolation between memory cell passing gate and capacitor
摘要:
A memory cell comprising a capacitor having a dielectric layer interposing first and second vertically disposed electrodes, an insulating lining located over the capacitor, and a transistor gate extension passing over the capacitor. A spacer isolates an end of one of the capacitor electrodes from the transistor gate extension. In one embodiment, the spacer includes a first non-planar profile configured to engage a second non-planar profile comprising ends of the one of the capacitor electrodes and the insulating lining.
信息查询
0/0