发明授权
- 专利标题: Multilayer ceramic capacitor and process for preparing the same
- 专利标题(中): 多层陶瓷电容器及其制备方法
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申请号: US10786526申请日: 2004-02-25
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公开(公告)号: US06839221B2公开(公告)日: 2005-01-04
- 发明人: Koshiro Sugimoto , Osamu Toyama , Koji Ishimine , Yuichi Komoto , Manabu Maeda
- 申请人: Koshiro Sugimoto , Osamu Toyama , Koji Ishimine , Yuichi Komoto , Manabu Maeda
- 申请人地址: JP Kyoto
- 专利权人: Kyocera Corporation
- 当前专利权人: Kyocera Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Hogan & Hartson LLP
- 优先权: JP2003-048234 20030525; JP2003-151139 20030528
- 主分类号: H01G4/12
- IPC分类号: H01G4/12 ; H01G4/30 ; H01G4/06 ; H01G4/20
摘要:
The mean grain size (D2) of the main crystal phase 11 in the external cover dielectric layers 3 is made larger than the mean grain size (D1) of the main crystal phase 11 in the dielectric ceramic layers 7, and the amount of the secondary phase (M2) in the external cover dielectric layer 3 is made more than the amount of the secondary phase (M1) in the dielectric ceramic layer 7, or the volume proportion of the secondary phase 16 to the main crystal phase 11 in the external cover dielectric layer 3 is made lower than the volume proportion of the secondary phase 16 to the main crystal phase 11 in the dielectric ceramic layer 7. This constitution produces the multilayer ceramic capacitor having a large number of thin layers stacked one on another that is capable of suppressing the occurrence of delamination between the external cover dielectric layers and the effective dielectric material section and between the effective dielectric material sections due to the difference in shrinkage by firing even when particle size of the dielectric material powder is made smaller.