Invention Grant
US06847701B2 X-ray detector with an applied stray radiation grid, and method for applying a stray radiation grid to an X-ray detector
失效
具有应用杂散辐射网格的X射线检测器,以及将杂散辐射栅格应用于X射线检测器的方法
- Patent Title: X-ray detector with an applied stray radiation grid, and method for applying a stray radiation grid to an X-ray detector
- Patent Title (中): 具有应用杂散辐射网格的X射线检测器,以及将杂散辐射栅格应用于X射线检测器的方法
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Application No.: US10277071Application Date: 2002-10-21
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Publication No.: US06847701B2Publication Date: 2005-01-25
- Inventor: Martin Hoheisel , Hartmut Skleritz
- Applicant: Martin Hoheisel , Hartmut Skleritz
- Applicant Address: DE Münich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Münich
- Agency: Schiff Hardin LLP
- Priority: DE10151568 20011023
- Main IPC: G21K1/02
- IPC: G21K1/02 ; G21K1/00

Abstract:
In an X-ray detector and method for applying a stray radiation grid onto an X-ray detector having detector elements arranged in a matrix that form a detector surface having detection regions sensitive to X-rays and less sensitive intermediate regions, a basic structure for the stray radiation grid is built up over the detector surface directly on the X-ray detector with a rapid prototyping technique and is subsequently coated or filled with a material that is highly absorbent for X-radiation. An absorbent structure thus arises that lies over the less sensitive intermediate regions of the detector surface. Moiré disturbances are avoided in the X-ray image exposure and the detective quantum efficiency (DQE) is increased.
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