Invention Grant
US06853926B2 Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
失效
用于非破坏性地检测涂层表面下的材料异常的系统和方法
- Patent Title: Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
- Patent Title (中): 用于非破坏性地检测涂层表面下的材料异常的系统和方法
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Application No.: US10455662Application Date: 2003-06-05
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Publication No.: US06853926B2Publication Date: 2005-02-08
- Inventor: Robert R. Alfano , Iosif Zeylikovich , Wubao Wang , Jamal Ali , Vincent Benischek , Yury Budansky
- Applicant: Robert R. Alfano , Iosif Zeylikovich , Wubao Wang , Jamal Ali , Vincent Benischek , Yury Budansky
- Applicant Address: US NY New York US MD Bethesda
- Assignee: Research Foundation of CUNY,Lockheed Martin Corporation
- Current Assignee: Research Foundation of CUNY,Lockheed Martin Corporation
- Current Assignee Address: US NY New York US MD Bethesda
- Agency: Dilworth & Barrese, LLP
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/89 ; G01B5/28
Abstract:
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.
Public/Granted literature
- US20030229458A1 Systems and methods for non-destructively detecting material abnormalities beneath a coated surface Public/Granted day:2003-12-11
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