发明授权
- 专利标题: Integrated adjustable short-haul/long-haul time domain reflectometry
- 专利标题(中): 综合可调短途/长途时域反射计
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申请号: US10080473申请日: 2002-02-22
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公开(公告)号: US06862546B2公开(公告)日: 2005-03-01
- 发明人: Nikos Kaburlasos , James Little , Vaishali Nikhade
- 申请人: Nikos Kaburlasos , James Little , Vaishali Nikhade
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: G01R31/11
- IPC分类号: G01R31/11 ; G06F19/00
摘要:
A method and system for performing integrated adjustable short-haul/long-haul time domain reflectometry (TDR). A TDR pulse count is set to a predetermined number. Next, a TDR pulse is transmitted through a cable. The width of the TDR pulse is a function of the multiplication of the TDR pulse count with the period of a TDR clock. It is then determined whether the TDR pulse has been reflected back. If the TDR pulse has not been reflected, the TDR pulse count is successively increased to successively increase the width of the transmitted TDR pulse until a reflection is detected—indicating an open in the cable. Furthermore, it eliminates false detections of cable opens. Moreover, the system can be combined into a line interface unit (LIU) integrated circuit such that TDR functionality can be performed automatically without the use of a technician.