发明授权
US06865222B1 Method and apparatus for testing a serial transmitter circuit 有权
用于测试串行发射机电路的方法和装置

  • 专利标题: Method and apparatus for testing a serial transmitter circuit
  • 专利标题(中): 用于测试串行发射机电路的方法和装置
  • 申请号: US09643499
    申请日: 2000-08-22
  • 公开(公告)号: US06865222B1
    公开(公告)日: 2005-03-08
  • 发明人: Robert Floyd Payne
  • 申请人: Robert Floyd Payne
  • 申请人地址: US TX Dallas
  • 专利权人: Texas Instruments Incorporated
  • 当前专利权人: Texas Instruments Incorporated
  • 当前专利权人地址: US TX Dallas
  • 代理商 J. Dennis Moore; W. James Brady, III; Frederick J. Telecky, Jr.
  • 主分类号: H04B3/46
  • IPC分类号: H04B3/46 H04L1/24
Method and apparatus for testing a serial transmitter circuit
摘要:
An integrated circuit (12) contains a serializing transmitter, including a phase locked loop (31) that supplies seven clocks (41) with different phases to a serializer circuit (32). The serializer circuit accepts 7-bit words at a parallel input (42), and outputs these words serially in an end-to-end manner on a twisted pair (17), as a clock signal. The serializer circuit also accepts 7-bit words on a further parallel input (43), and transmits them serially in an end-to-end manner on a twisted pair (18), as serialized data. The integrated circuit also includes a built-in self-test circuit (33), which can supply test information to the two parallel inputs of the serializer circuit, and which can monitor the two twisted pairs while the serializer circuit operates at high data rates typical of normal operation, in order to detect any errors introduced by the serializer circuit. The self-test circuit produces a single digital output (48) to indicate whether an error has been detected.
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