发明授权
- 专利标题: Iterative X-ray scatter correction method and apparatus
- 专利标题(中): 迭代X射线散射校正方法和装置
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申请号: US09683255申请日: 2001-12-05
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公开(公告)号: US06879715B2公开(公告)日: 2005-04-12
- 发明人: Peter Michael Edic , Armin Horst Pfoh , Shankar Visvanathan Guru
- 申请人: Peter Michael Edic , Armin Horst Pfoh , Shankar Visvanathan Guru
- 申请人地址: US NY Niskayuna
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Niskayuna
- 代理商 Penny A. Clarke; Patrick K. Patnode
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T5/00
摘要:
An apparatus and a method of processing a collection of uncorrected radiographs are described with the apparatus comprising an X-ray scatter compensator and a controller. The compensator is configured for iteratively generating a refined value of a normalized estimated X-ray scatter signal corresponding to an uncorrected radiograph of said collection of uncorrected radiographs. The controller is configured to be coupled to the compensator and further configured to subtract said refined value of said normalized estimated X-ray scatter signal from a corresponding normalized total X-ray signal of a respective one of said uncorrected radiographs so as to form a corresponding corrected radiograph.
公开/授权文献
- US20030103666A1 Iterative X-ray scatter correction method and apparatus 公开/授权日:2003-06-05
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