Invention Grant
US06885503B2 Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations
失效
用于短波长电磁辐射的消色差菲涅耳光学基于光刻
- Patent Title: Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations
- Patent Title (中): 用于短波长电磁辐射的消色差菲涅耳光学基于光刻
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Application No.: US10289151Application Date: 2002-11-05
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Publication No.: US06885503B2Publication Date: 2005-04-26
- Inventor: Wenbing Yun , Yuxin Wang , Kenneth W. Nill
- Applicant: Wenbing Yun , Yuxin Wang , Kenneth W. Nill
- Applicant Address: US CA Concord
- Assignee: Xradia, Inc.
- Current Assignee: Xradia, Inc.
- Current Assignee Address: US CA Concord
- Agent John P. O'Banion
- Main IPC: G02B3/08
- IPC: G02B3/08 ; G02B27/44 ; G03F7/20

Abstract:
A lithography apparatus having achromatic Fresnel objective (AFO) that combines a Fresnel zone plate and a refractive Fresnel lens. The zone plate provides high resolution for imaging and focusing, while the refractive lens takes advantage of the refraction index change properties of appropriate elements near absorption edges to recombine the electromagnetic radiation of different energies dispersed by the zone plate. This compound lens effectively solves the high chromatic aberration problem of zone plates. The lithography apparatus allows the use of short wavelength radiation in the 1-15 nm spectral range to print high resolution features as small as 20 nm.
Public/Granted literature
- US20040085641A1 Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations Public/Granted day:2004-05-06
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