An improved voltage reduction circuit and method is described that incorporates an independently controllable back bias voltage for increased gate/bulk fields in isolation well voltage reduction transistors that couple to and reduce external voltages that are too high for the integrated circuit process technology limits. The improved voltage reduction circuit and method allows for a higher overall available voltage and current flow for regulation by the circuit. Additionally, the improved voltage reduction circuit and method reduces voltage reduction circuit size by allowing for efficient implementation in a single isolation well. Furthermore, the improved voltage reduction circuit and method includes a back bias voltage control circuit that turns on and regulates the back bias voltage and avoids the problem of reverse bias conditions.