发明授权
- 专利标题: In situ tumor temperature profile measuring probe and method
- 专利标题(中): 原位肿瘤温度曲线测量探针和方法
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申请号: US10090576申请日: 2002-03-05
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公开(公告)号: US06916290B2公开(公告)日: 2005-07-12
- 发明人: Kristina Helena Valborg Hedengren , William Paul Kornrumpf , Mark Lloyd Miller , Egidijus Edward Uzgiris
- 申请人: Kristina Helena Valborg Hedengren , William Paul Kornrumpf , Mark Lloyd Miller , Egidijus Edward Uzgiris
- 申请人地址: US NY Niskayuna
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Niskayuna
- 代理商 Jean K. Testa; Christian G. Cabou
- 主分类号: A61B5/00
- IPC分类号: A61B5/00 ; A61B5/01 ; G01K7/00
摘要:
An in situ breast tumor temperature profile measuring probe includes a rod, thermal sensors and electrical output leads. The thermal sensors are formed in spaced apart holes in an outer insulating layer of the rod and a common electrical input lead to provide an electrical input signal to the thermal sensors is disposed below and has portions exposed at the holes and electrically connected to the thermal sensors. The thermal sensors receive the electrical input signal from the common electrical input lead, sense the temperature of biological matter adjacent to the thermal sensors and produce an electrical output signal correlated thereto. Each electrical output lead mounted to the outer insulating layer is in electrical contact with a different one of the thermal sensors to receive the electrical output signal from the one thermal sensor and output the same.
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