发明授权
- 专利标题： Method for determining formation quality factor from seismic data
- 专利标题（中）： 从地震数据确定地层质量因子的方法
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申请号： US10687129申请日： 2003-10-16
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公开(公告)号： US06931324B2公开(公告)日： 2005-08-16
- 发明人: M. Turhan Taner , Sven Treitel
- 申请人： M. Turhan Taner , Sven Treitel
- 申请人地址： US TX Houston
- 专利权人： RDSPI, L.P.
- 当前专利权人： RDSPI, L.P.
- 当前专利权人地址： US TX Houston
- 代理商 Richard A. Fagin
- 主分类号： G01V1/28
- IPC分类号： G01V1/28 ; G01V1/30 ; G06F19/00
摘要：
A method is disclosed for calculating the quality factor Q from a seismic data trace. The method includes calculating a first and a second minimum phase inverse wavelet at a first and a second time interval along the seismic data trace, synthetically dividing the first wavelet by the second wavelet, Fourier transforming the result of the synthetic division, calculating the logarithm of this quotient of Fourier transforms and determining the slope of a best fit line to the logarithm of the quotient.
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