Invention Grant
- Patent Title: Substrate cleaning method and substrate cleaning apparatus
- Patent Title (中): 基板清洗方法和基板清洗装置
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Application No.: US10607976Application Date: 2003-06-30
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Publication No.: US06945259B2Publication Date: 2005-09-20
- Inventor: Kenji Masui , Akio Kosaka , Hidehiro Watanabe
- Applicant: Kenji Masui , Akio Kosaka , Hidehiro Watanabe
- Applicant Address: JP Kawasaki
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Kawasaki
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2000-190696 20000626
- Main IPC: B08B3/02
- IPC: B08B3/02 ; B08B3/08 ; B08B3/12 ; H01L21/00 ; H01L21/304 ; B06B3/00

Abstract:
A substrate cleaning apparatus is provided that includes a cleaning cup for receiving a to-be-cleaned substrate, a table in the cleaning cup, a first, second, and third nozzles, a pure water heating mechanism configured to supply hot pure water, a branch line, a control mechanism, and an open/close valve, provided between the branch line and the pipe, wherein the open/close valve is configured to interrupt emission of hot water from the third nozzle by opening the open/close valve to lower the pressure in the pipe.
Public/Granted literature
- US20040000324A1 Substrate cleaning method and substrate cleaning apparatus Public/Granted day:2004-01-01
Information query
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