Invention Grant
- Patent Title: System and method for precise location of a point of interest
- Patent Title (中): 用于精确定位感兴趣点的系统和方法
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Application No.: US09876985Application Date: 2001-06-08
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Publication No.: US06950552B2Publication Date: 2005-09-27
- Inventor: Dinesh Nair , Ram Rajagopal , Lothar Wenzel
- Applicant: Dinesh Nair , Ram Rajagopal , Lothar Wenzel
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark S. Williams
- Main IPC: G06K9/20
- IPC: G06K9/20 ; G06K9/50 ; G06K9/52 ; G06K9/46

Abstract:
A scanning system and method for locating a point within a region. The method may: 1) determine or locate a region of interest in the region; 2) determine one or more characteristics of the region of interest within the region, wherein the region of interest includes the point of interest; 3) determine a continuous trajectory based on the one or more characteristics of the region of interest; 4) measure the region of interest at a plurality of points along the continuous trajectory to generate a sample data set; 5) perform a surface fit of the sample data set using the approximate model to generate a parameterized surface; and 6) calculate a location of the point of interest based on the parameterized surface. The method may include measuring the region at and/or near the calculated location to confirm the solution, and may also include generating output comprising the results.
Public/Granted literature
- US20020146172A1 System and method for precise location of a point of interest Public/Granted day:2002-10-10
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