发明授权
- 专利标题： Interferometer alignment
- 专利标题（中）： 干涉仪校准
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申请号： US10342578申请日： 2003-01-15
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公开(公告)号： US06952266B2公开(公告)日： 2005-10-04
- 发明人: Russell E. Abbink
- 申请人： Russell E. Abbink
- 申请人地址： US NM Albuquerque
- 专利权人： InLight Solutions, Inc.
- 当前专利权人： InLight Solutions, Inc.
- 当前专利权人地址： US NM Albuquerque
- 代理商 V. Gerald Grafe
- 主分类号： G01B9/02
- IPC分类号： G01B9/02
摘要：
The present invention provides means for correcting interferometer alignment errors through the use of corrective elements. The corrective elements allow reduced accuracy in the assembly process. Residual alignment errors caused by imprecise mounting of permanently mounted components can be corrected using relatively low precision positioning of corrector components. The technique can be particularly applicable to the mass production of interferometers, for which achieving and maintaining the required assembly tolerances might otherwise be prohibitively expensive. Interferometers according to the present invention can be used, for example, in optical spectroscopy and in interferometers.
公开/授权文献
- US20040136006A1 Interferometer alignment 公开/授权日：2004-07-15
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