- 专利标题: Gapped-plate capacitor
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申请号: US10853851申请日: 2004-05-25
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公开(公告)号: US06958901B2公开(公告)日: 2005-10-25
- 发明人: David Y. Kao , James Peacher
- 申请人: David Y. Kao , James Peacher
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理商 Charles Brantley
- 主分类号: H01L21/334
- IPC分类号: H01L21/334 ; H01L29/94 ; H01G4/228
摘要:
In a semiconductor device, a capacitor is provided which has a gap in at least one of its plates. The gap is small enough so that fringe capacitance between the sides of this gap and the opposing plate at least compensates, if not overcompensates, for the missing conductive material that would otherwise fill the gap and add to parallel capacitance. As a result, the capacitance of a storage device can be increased without taking up more die area. Alternatively, the size of a capacitor can be reduced with no decrease in capacitance. Various gap configurations and methods for providing them are also within the scope of the current invention.
公开/授权文献
- US20040264104A1 Gapped-plate capacitor 公开/授权日:2004-12-30
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