发明授权
- 专利标题: Probability constrained optimization for electrical fabrication control
- 专利标题(中): 概率约束优化电气制造控制
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申请号: US10335748申请日: 2003-01-02
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公开(公告)号: US06959224B2公开(公告)日: 2005-10-25
- 发明人: Richard P. Good , Gregory A. Cherry , Jin Wang
- 申请人: Richard P. Good , Gregory A. Cherry , Jin Wang
- 申请人地址: US TX Austin
- 专利权人: Advanced Micro Devices, Inc.
- 当前专利权人: Advanced Micro Devices, Inc.
- 当前专利权人地址: US TX Austin
- 代理机构: Williams, Morgan & Amerson
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; G05B19/418 ; H01L21/66 ; G06F19/00
摘要:
A method includes defining a model of a process for manufacturing a device, the process including a plurality of steps. A plurality of inline process targets are defined for at least a subset of the process steps. The model relates the inline process targets to a plurality of process output parameters. A first set of probabilistic constraints for the inline process targets is defined. A second set of probabilistic constraints for the process output parameters is defined. An objective function is defined based on the model and the plurality of process output parameters. A trajectory of the process output parameters is determined by optimizing the objective function subject to the first and second sets of probabilistic constraints for each process step to determine values for the inline process targets at each process step, the optimization being iterated after completion of each process step for the remaining process steps.
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