Invention Grant
- Patent Title: Test support program and test support method
- Patent Title (中): 测试支持程序和测试支持方法
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Application No.: US10828057Application Date: 2004-04-20
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Publication No.: US06963815B2Publication Date: 2005-11-08
- Inventor: Yuzuru Watanabe , Yuichi Takada , Yasuyuki Fujikawa , Kenichi Yamashita
- Applicant: Yuzuru Watanabe , Yuichi Takada , Yasuyuki Fujikawa , Kenichi Yamashita
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Greer, Burns & Crain, Ltd.
- Priority: JP2003-208522 20030825
- Main IPC: G06F11/28
- IPC: G06F11/28 ; G06F11/22 ; G06F13/00 ; G06F19/00

Abstract:
A test support program to effectively and reliably check performance of functions which operate with other unspecified servers. A pair of a request message and a response message is stored as a message log. When a processing function based on a program under development being checked outputs a test request message, a computer selects a message log appropriate to the test request message as a template message under preset selection rules. The computer creates a test response message by editing the response message of the selected template message under preset editing rules. Then the computer sends the created test response message as a response to the test request message.
Public/Granted literature
- US20050049815A1 Test support program and test support method Public/Granted day:2005-03-03
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