发明授权
- 专利标题: Three-dimensional measuring device
- 专利标题(中): 三维测量装置
-
申请号: US10740567申请日: 2003-12-22
-
公开(公告)号: US06970802B2公开(公告)日: 2005-11-29
- 发明人: Kazunori Ban , Ichiro Kanno
- 申请人: Kazunori Ban , Ichiro Kanno
- 申请人地址: JP Yamanashi
- 专利权人: Fanuc LTD
- 当前专利权人: Fanuc LTD
- 当前专利权人地址: JP Yamanashi
- 代理机构: Staas & Halsey LLP
- 优先权: JP2002/369809 20021220
- 主分类号: G01B11/00
- IPC分类号: G01B11/00 ; B25J9/16 ; B25J13/08 ; G01B11/03 ; G01B21/04 ; G01C17/00 ; G05B19/18
摘要:
Three-dimensional measurement capable of reducing an error in coupling robot and sensor coordinate systems and adverse effects of backlash in a robot. A position/orientation of the robot for obtaining a measurement value on the sensor coordinate system is set beforehand with a workpiece positioned at a reference position. Then, the robot is moved to a preparatory measurement position, a preparatory measurement for the workpiece positioned at an arbitrary position is performed (SV1), and based on a measurement result, a main measurement position is calculated (SV2). Next, an auxiliary position is determined (SV3), which serves as a start position from which a movement to the main measurement position can be made without making a reversal of respective axes. The robot is moved to the auxiliary position (SV4), and to the main measurement position (SV5), and a measurement for the workpiece is made and a measurement result is stored (SV6).
公开/授权文献
- US20040133382A1 Three-dimensional measuring device 公开/授权日:2004-07-08
信息查询