Invention Grant
- Patent Title: Extended multi-spot computed tomography x-ray source
- Patent Title (中): 扩展多点计算机断层扫描X射线源
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Application No.: US10669613Application Date: 2003-09-24
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Publication No.: US06983035B2Publication Date: 2006-01-03
- Inventor: John Scott Price , Wayne Frederick Block , Mark Vermilyea
- Applicant: John Scott Price , Wayne Frederick Block , Mark Vermilyea
- Applicant Address: US WI Waukesha
- Assignee: GE Medical Systems Global Technology Company, LLC
- Current Assignee: GE Medical Systems Global Technology Company, LLC
- Current Assignee Address: US WI Waukesha
- Agency: Dougherty Clements
- Agent Christopher L. Bernard; Peter J. Vogel
- Main IPC: H01J35/08
- IPC: H01J35/08

Abstract:
Systems and methods for obtaining multi-slice images having a total thickness of up to about 160 mm or more in a single gantry rotation in computed tomography or volume computed tomography are described. One embodiment comprises an extended, multi-spot x-ray source for computed tomography or volume computed tomography imaging, comprising: an electron gun capable of producing a plurality of electron beams, each electron beam focused at a predetermined distance and aimed in a predetermined direction; and a plurality of targets positioned to receive the electron beams and generate x-rays in response thereto, each target comprising a predetermined focal spot thereon, wherein each electron beam is synchronized to strike, at an appropriate time, a predetermined target comprising a predetermined focal spot thereon.
Public/Granted literature
- US20050063514A1 Extended multi-spot computed tomography x-ray source Public/Granted day:2005-03-24
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