发明授权
US06992364B2 Array substrate for use in LCD device and method of fabricating same
有权
用于LCD装置的阵列基板及其制造方法
- 专利标题: Array substrate for use in LCD device and method of fabricating same
- 专利标题(中): 用于LCD装置的阵列基板及其制造方法
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申请号: US10653283申请日: 2003-09-03
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公开(公告)号: US06992364B2公开(公告)日: 2006-01-31
- 发明人: Soon-Sung Yoo , Dong-Yeung Kwak , Hu-Sung Kim , Yu-Ho Jung , Yong-Wan Kim , Duk-Jin Park , Woo-Chae Lee
- 申请人: Soon-Sung Yoo , Dong-Yeung Kwak , Hu-Sung Kim , Yu-Ho Jung , Yong-Wan Kim , Duk-Jin Park , Woo-Chae Lee
- 申请人地址: KR Seoul
- 专利权人: LG.Philips LCD Co., Ltd.
- 当前专利权人: LG.Philips LCD Co., Ltd.
- 当前专利权人地址: KR Seoul
- 代理机构: Morgan Lewis & Bockius LLP
- 优先权: KR2000-6450 20000211
- 主分类号: H01L29/00
- IPC分类号: H01L29/00
摘要:
A TFT array substrate has a PAI pattern, and the PAI pattern has an over-etched portion of the pure amorphous silicon layer. This over-etched portion prevents a short between the pixel electrode and the pure amorphous silicon layer (i.e., the active layer). The over-etched portion also enables the aperture ratio to increase a gate line over a said substrate; a data line over the said substrate being perpendicular to the gate line; a passivation layer covering the data line, the passivation layer divided into a residual passivation layer and a etched passivation layer; a doped amorphous silicon layer formed under the data line and corresponding in size to the data line; a pure amorphous silicon layer formed under the doped amorphous silicon layer and having a over-etched portion in the peripheral portions, wherein the over-etched portion is over-etched from the edges of the residual passivation layer toward the inner side; an insulator layer under the pure amorphous silicon layer; a TFT formed near the crossing of the gate line and the data line; and a pixel electrode overlapping the data line and contacting the TFT.
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