发明授权
- 专利标题: Birefringence measurement of large-format samples
- 专利标题(中): 大幅面样品的双折射测量
-
申请号: US10359529申请日: 2003-02-05
-
公开(公告)号: US06992758B2公开(公告)日: 2006-01-31
- 发明人: Andrew D. Kaplan , James C. Mansfield , Douglas C. Mark
- 申请人: Andrew D. Kaplan , James C. Mansfield , Douglas C. Mark
- 申请人地址: US OR Hillsboro
- 专利权人: Hinds Instruments, INC
- 当前专利权人: Hinds Instruments, INC
- 当前专利权人地址: US OR Hillsboro
- 代理机构: Ipsolon LLP
- 主分类号: G01N21/01
- IPC分类号: G01N21/01
摘要:
The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.
公开/授权文献
- US20040075834A1 Birefringence measurement of large-format samples 公开/授权日:2004-04-22
信息查询