- 专利标题: Method and system for automated outlying feature and outlying feature background detection during processing of data scanned from a molecular array
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申请号: US09895756申请日: 2001-06-29
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公开(公告)号: US06993172B2公开(公告)日: 2006-01-31
- 发明人: Scott D. Connell , Herbert F. Cattell , Glenda C. Delenstarr , Nicholas M Sampas , Andreas N. Dorsel
- 申请人: Scott D. Connell , Herbert F. Cattell , Glenda C. Delenstarr , Nicholas M Sampas , Andreas N. Dorsel
- 申请人地址: US CA Palo Alto
- 专利权人: Agilent Technologies, Inc.
- 当前专利权人: Agilent Technologies, Inc.
- 当前专利权人地址: US CA Palo Alto
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
A method and system for employing pixel-based, signal-intensity data contained within areas of a scanned image of a molecular array corresponding to features and feature backgrounds in order to determine whether or not the features or feature backgrounds have non-uniform signal intensities and are thus outlier features and outlier feature backgrounds. A calculated, estimated variance for the signal intensities within a feature or feature background is compared to a maximum allowable variance calculated for the feature or feature background based on a signal intensity variance model. When the experimental variance is less than or equal to the maximum allowable variance, the feature or feature background is considered to have acceptable signal-intensity uniformity. Otherwise, the feature or feature background is flagged as an outlier feature or outlier feature background.
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