发明授权
- 专利标题: Production method of α-SiC wafer
- 专利标题(中): α-SiC晶片的生产方法
-
申请号: US10478649申请日: 2002-05-24
-
公开(公告)号: US06995036B2公开(公告)日: 2006-02-07
- 发明人: Shigehiro Nishino , Kazutoshi Murata , Yoshiharu Chinone
- 申请人: Shigehiro Nishino , Kazutoshi Murata , Yoshiharu Chinone
- 申请人地址: JP Tokyo
- 专利权人: Mitsui Engineering & Shipbuilding Co., Ltd.
- 当前专利权人: Mitsui Engineering & Shipbuilding Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 优先权: JP2001-157668 20010525
- 国际申请: PCT/JP02/05040 WO 20020524
- 国际公布: WO02/097174 WO 20021205
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
The present invention has its object to make it possible to produce an α-SiC wafer with stability and good reproducibility at low cost without using a seed crystal substrate that is expensive and less available. In each of crucibles 11a, 11b, 11c, and so on, a β-SiC substrate 19 and an SiC raw material 17 are placed to face each other in close proximity. These crucibles are stacked in layers, and placed inside a radiation tube 40. The radiation tube 40 is heated by an induction heating coil 23, radiates radiation heat, and uniformly heats the crucibles 11a, 11b, 11c and so on. The SiC raw material in each of the crucibles is sublimated and recrystallized on a surface of the β-SiC substrate 19.
公开/授权文献
- US20040241343A1 Production method of alpha-sic wafer 公开/授权日:2004-12-02