发明授权
- 专利标题: Patterning method using a photomask
- 专利标题(中): 使用光掩模的图案化方法
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申请号: US10688960申请日: 2003-10-21
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公开(公告)号: US07001711B2公开(公告)日: 2006-02-21
- 发明人: Akio Misaka
- 申请人: Akio Misaka
- 申请人地址: JP Osaka
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP11-316752 19991108
- 主分类号: G03C5/00
- IPC分类号: G03C5/00
摘要:
An isolated light-shielding pattern formed from a light-shielding film region 101 and a phase shift region 102 is formed on a transparent substrate 100 serving as a mask. The phase shift region 102 has a phase difference with respect to a light-transmitting region of the transparent substrate 100. Moreover, the width of the phase shift region 102 is set such that a light-shielding property of the phase shift region 102 becomes at least about the same as that of a light-shielding film having the same width.
公开/授权文献
- US20040081899A1 Patterning method using a photomask 公开/授权日:2004-04-29
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