发明授权
- 专利标题： Optically stimulated luminescence radiation dosimetry method to determine integrated doses and dose rates and a method to extend the upper limit of measureable absorbed radiation doses during irradiation
- 专利标题（中）： 光学刺激的发光辐射剂量测定方法来确定综合剂量和剂量率，以及延长照射时可测量吸收辐射剂量上限的方法
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申请号： US10852309申请日： 2004-05-24
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公开(公告)号： US07002163B2公开(公告)日： 2006-02-21
- 发明人: Jerimy C. Polf , Razvan Gaza , Stephen W. S. McKeever
- 申请人： Jerimy C. Polf , Razvan Gaza , Stephen W. S. McKeever
- 申请人地址： US OK Stillwater
- 专利权人： The Board of Regents for Oklahoma State University
- 当前专利权人： The Board of Regents for Oklahoma State University
- 当前专利权人地址： US OK Stillwater
- 代理机构： Fellers, Snider, Blankenship, Bailey & Tippens, P.C.
- 主分类号： G01T1/10
- IPC分类号： G01T1/10
摘要：
There is provided herein a system and method for obtaining measurements of radiation exposure in real time using OSL and for obtaining improved accurate OSL measurements over a greater range of radiation exposures. In a preferred embodiment a signal-versus-dose response is obtained from an OSL dosimeter that is linear over all doses and does not exhibit saturation effects. The desired response is preferably calculated from the measured OSL-versus-time response from a suitable dosimeter obtained during irradiation. To obtain the desired response from the measured OSL data each measured OSL point has to be corrected for the depletion of the trapped electron concentration that occurs during each illumination period.
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