发明授权
US07002214B1 Ultra-thin body super-steep retrograde well (SSRW) FET devices 有权
超薄体超陡逆行井(SSRW)FET器件

Ultra-thin body super-steep retrograde well (SSRW) FET devices
摘要:
A method of manufacture of a Super Steep Retrograde Well Field Effect Transistor device starts with an SOI layer formed on a substrate, e.g. a buried oxide layer. Thin the SOI layer to form an ultra-thin SOI layer. Form an isolation trench separating the SOI layer into N and P ground plane regions. Dope the N and P ground plane regions formed from the SOI layer with high levels of N-type and P-type dopant. Form semiconductor channel regions above the N and P ground plane regions. Form FET source and drain regions and gate electrode stacks above the channel regions. Optionally form a diffusion retarding layer between the SOI ground plane regions and the channel regions.
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